Mumbai, India

Nikhil Fernandes

This inventor holds 1 USPTO granted patent. Top assignee: Fractal Analytics Private Limited. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nikhil Fernandes. Retrieved from https://idiyas.com/inventor/nikhil-fernandes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Nikhil Fernandes: Innovator in Anomaly Detection

Introduction

Nikhil Fernandes is a prominent inventor based in Mumbai, India. He has made significant contributions to the field of technology, particularly in the area of anomaly detection within Internet of Things (IoT) sensor networks.

Latest Patents

Nikhil holds a patent for a "System and method for unsupervised anomaly detection." This innovative approach utilizes deep learning techniques to identify anomalies in IoT sensor networks or manufacturing execution systems. The method employs an ensemble of multiple generative adversarial networks to enhance the accuracy of anomaly detection.

Career Highlights

Nikhil Fernandes is currently associated with Fractal Analytics Private Limited, where he applies his expertise in data analytics and machine learning. His work focuses on developing advanced solutions that leverage artificial intelligence to solve complex problems in various industries.

Collaborations

Some of Nikhil's notable coworkers include Shivam Bhardwaj and Nitish Pant, who collaborate with him on various projects within the company.

Conclusion

Nikhil Fernandes is a talented inventor whose work in anomaly detection is paving the way for advancements in IoT technology. His contributions are essential in enhancing the reliability and efficiency of sensor networks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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