Mississauga, Canada

Nikeitha Alleyne

This inventor holds 1 USPTO granted patent. Top assignee: Cdw Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nikeitha Alleyne. Retrieved from https://idiyas.com/inventor/nikeitha-alleyne

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nikeitha Alleyne and Machine-Learning-Assisted Security Threat Analysis

Introduction

Nikeitha Alleyne is an inventor based in Mississauga, Canada, whose listed patent concerns using machine learning to reduce alert fatigue in security threat analysis. The supplied information identifies him as working at CDW Corporation and lists one patent.

Latest Patents

Alleyne’s patent, “Using Machine Learning to Reduce Alert Fatigue,” describes methods and systems for improved security threat analysis. The invention receives electronic security data, generates a security threat diagnosis, and displays that diagnosis. Its described system includes a user interface, one or more processors, and computer-readable memory containing instructions for carrying out those steps. The patent also describes a tangible machine-readable medium with instructions that cause a machine to perform the same process. The supplied data lists 1 patent.

Career Highlights

The available information connects Alleyne’s work at CDW Corporation with an invention focused on presenting security threat diagnoses from electronic security data. The patent’s stated aim is to help reduce alert fatigue through machine-learning-assisted analysis.

Collaborations

Vinamra Bhatnagar is identified in the supplied information as Alleyne’s coworker. No further details about their collaboration are provided.

Conclusion

Nikeitha Alleyne’s listed patent addresses security alert fatigue by describing a process and system that analyze electronic security data and present a threat diagnosis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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