Winchester, United Kingdom

Nigel Thomas Holliday

This inventor holds 1 USPTO granted patent. Top assignee: University of Leeds. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nigel Thomas Holliday. Retrieved from https://idiyas.com/inventor/nigel-thomas-holliday

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovations of Nigel Thomas Holliday

Introduction

Nigel Thomas Holliday is a notable inventor based in Winchester, GB. He has made significant contributions to the field of electrical engineering, particularly in the area of data processing systems.

Latest Patents

Holliday holds a patent for an "EIT data processing system and method." This innovative system focuses on electrical impedance tomography (EIT) data processing, specifically designed for acquiring and processing data from two-phase flows. The system includes a dual-plane sensor, a variety of digital signal processing modules arranged in a data pipeline processing configuration, and multiple data acquisition subsystems that communicate with the first of the digital signal processing modules.

Career Highlights

Holliday is affiliated with the University of Leeds, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various industries.

Collaborations

Some of his notable coworkers include Yixin Ma and Yunfeng Dai, who have collaborated with him on various projects.

Conclusion

Nigel Thomas Holliday's contributions to electrical engineering and data processing systems highlight his innovative spirit and dedication to advancing technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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