Curno, Italy

Nicoló Nepote

This inventor holds 1 USPTO granted patent. Top assignee: Brembo S.p.a.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicoló Nepote. Retrieved from https://idiyas.com/inventor/nicolo-nepote-wcp4w3ct

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nicoló Nepote and Brake Disc Thermal Monitoring

Introduction

Nicoló Nepote is an inventor associated with Curno, Italy, and Brembo S.p.A. His patent work addresses computerized analysis of thermal information from brake discs during dynamic operating conditions.

Latest Patents

Nepote is credited with 1 patent: “Method for Automatically Detecting, by Means of Computerized Processing, Thermal Information About a Surface of a Brake Disc Under Dynamic Operating Conditions.” The method acquires digital images or video, converts the images or video frames into matrix data, and processes that data using image-analysis or computer-vision algorithms. It is designed to provide information about temperature changes and the location or distribution of hot spots, bands, or zones on a brake disc’s surface.

Career Highlights

Nepote’s listed invention focuses on applying computerized image processing to brake testing and thermal monitoring. The approach can help identify how heat develops and where it concentrates on a disc under operating conditions.

Collaborations

Nepote’s listed company affiliation is Brembo S.p.A. His named coworkers include Francesca Maria Arioli and Luigi Roggia.

Conclusion

Nicoló Nepote’s patent describes a computer-vision-based method for tracking temperature evolution and identifying thermal patterns on brake discs, reflecting an application of image processing to braking technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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