Stuttgart, Germany

Nicole Ventsch

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Robert Bosch. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicole Ventsch. Retrieved from https://idiyas.com/inventor/nicole-ventsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nicole Ventsch: Inventor of a Higher-Resolution Thermal Imaging Method.

Introduction

Nicole Ventsch is an inventor associated with Stuttgart, Germany, and Robert Bosch. Her listed patent concerns a method for increasing the resolution of thermal images captured by a thermal imaging camera.

Latest Patents

Ventsch is credited with 1 patent: “Method for Providing a Thermal Image of a Thermal Imaging Camera with an Increased Resolution.” The method uses a vibratory motor to move the camera while it captures image data, including at least two thermal images. It then determines a higher-resolution thermal image from the captured data. The patent also describes a computer program, a device, and a storage medium for implementing the method.

Career Highlights

The available information associates Ventsch’s patent work with Robert Bosch. The invention addresses thermal-image resolution by combining camera movement during image capture with a method for processing the resulting images.

Collaborations

Andreas Frischen and Michael Frank are identified as Ventsch’s coworkers. The provided information does not specify their roles in the patent or the invention.

Conclusion

Nicole Ventsch’s listed invention focuses on improving thermal imaging resolution through coordinated image capture and processing, and is associated with her work at Robert Bosch.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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