Houston, TX, United States of America

Nicolas Zilberstein

This inventor holds 1 USPTO granted patent. Top assignee: Interdigital Patent Holdings, Inc.. Active years: 2026.


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Nicolas Zilberstein

Introduction

Nicolas Zilberstein is an accomplished inventor based in Houston, TX. He has made significant contributions to the field of artificial intelligence and machine learning. His innovative work focuses on developing systems and methods that enhance the monitoring of AI/ML models.

Latest Patents

Nicolas holds a patent for "Systems and methods for statistics based and topology based interoperable AI/ML model monitoring." This patent describes a method implemented by a wireless transmit/receive unit (WTRU) that includes receiving configuration information related to topology methods used to evaluate the topology of a dataset. The method involves selecting a topology method, determining topological features of the dataset, and comparing input space topological features to latent space topological features. The goal is to ensure that the WTRU-side model meets the specified metrics associated with the selected topology method.

Career Highlights

Nicolas Zilberstein is currently employed at Interdigital Patent Holdings, Inc. His work at the company emphasizes the integration of advanced technologies in AI and machine learning. He has demonstrated a strong commitment to innovation and excellence in his field.

Collaborations

Some of Nicolas's notable coworkers include Akshay Malhotra and Yugeswar Deenoo Narayanan Thangaraj. Their collaborative efforts contribute to the advancement of technology and innovation within their organization.

Conclusion

Nicolas Zilberstein is a prominent inventor whose work in AI and machine learning has led to significant advancements in the field. His patent and contributions reflect his dedication to innovation and technology.

Profile summary based on public USPTO records.
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