Duluth, GA, United States of America

Nicolas Veltmaat

This inventor holds 1 USPTO granted patent. Top assignee: Rockwell Collins, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicolas Veltmaat. Retrieved from https://idiyas.com/inventor/nicolas-veltmaat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nicolas Veltmaat and Aircraft Radar Innovation

Introduction

Nicolas Veltmaat is an inventor based in Duluth, Georgia, and is associated with Rockwell Collins, Inc. His patent work addresses aircraft radar technology for terrain profiling and altitude measurement.

Latest Patents

Veltmaat is named on 1 patent: “System and Method for Aircraft Altimetry and Terrain Profiling via Forward Looking Active Electronically Scanned Array (AESA) Radar.” The invention uses a single aircraft-mounted AESA radar to scan in selected directions, detect ground targets, and determine their range and Doppler velocity. It also directs the radar downward to scan terrain beneath the aircraft and estimate altitude, with inertial sensors helping establish the radar’s orientation. The system uses the resulting measurements to calculate target pointing angles and vertical and horizontal distances from the aircraft.

Career Highlights

Veltmaat’s patent reflects work on integrating forward-looking terrain profiling and downward-looking altimetry into one radar system. This approach is designed to provide aircraft with information about both nearby terrain and their altitude.

Collaborations

The available information associates Veltmaat with Rockwell Collins, Inc. His patent concerns aircraft radar capabilities, but no additional collaborators are identified in the supplied details.

Conclusion

Nicolas Veltmaat’s patented AESA radar system combines terrain profiling and aircraft altimetry, illustrating his contribution to aviation sensing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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