Gif-sur-Yvette, France

Nicolas Tranchant

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignees: Commissariat a L'energie Atomique Et Aux Energies Alternatives, Thales. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicolas Tranchant. Retrieved from https://idiyas.com/inventor/nicolas-tranchant

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Nicolas Tranchant: Inventor of an X-Ray Generator with an Integrated Flow Sensor.

Introduction

Nicolas Tranchant is an inventor based in Gif-sur-Yvette, France. His patent work includes an X-ray generator design that integrates a sensor into the generator’s diamond-based transmission window.

Latest Patents

Tranchant is associated with 1 patent: “X-ray Generator with a Built-In Flow Sensor.” The invention describes an X-ray generator tube with a cathode and an anode inside a vacuum chamber. The cathode emits an electron beam toward a target on the anode, producing X-rays that pass through a diamond-based transmission window in the chamber wall. The design integrates a diamond-based X-ray sensor into that window.

Career Highlights

Tranchant has been associated with Commissariat à l’Énergie Atomique et aux Énergies Alternatives and Thales. His patent reflects work on integrating X-ray sensing into the transmission window of a generator.

Collaborations

His listed coworkers include Pascal Ponard and Colin Delfaure.

Conclusion

Nicolas Tranchant’s patent describes a compact approach to combining X-ray transmission and sensing in a diamond-based window, connecting his inventive work with his professional associations and collaborators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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