Company Filing History:
2 out of 575 
1 out of 41 
1 out of 288 Years Active: 2012-2020
Title: Innovations and Contributions of Inventor Nicolas Hengartner
Introduction
Nicolas Hengartner is a notable inventor based in Los Alamos, NM (US). He has made significant contributions to the field of statistical analysis and charged particle detection, holding a total of three patents. His work focuses on innovative methods that enhance the understanding and application of complex data.
Latest Patents
One of Hengartner's latest patents is titled "Decorrelating effects in multiple linear regression to decompose and attribute risk to common and proper effects." This invention addresses the challenge of risk decomposition by allowing for the identification of multiple causes associated with various attributes. The method minimizes correlation between different sets of risk factors, utilizing a hidden factor model to achieve this goal.
Another significant patent is "Robust statistical reconstruction for charged particle tomography." This invention involves systems and methods for detecting charged particles, including the statistical reconstruction of object volume scattering density profiles. The approach employs a maximum likelihood estimate using an expectation maximization algorithm to reconstruct the scattering density, which can be crucial for identifying objects in various applications, such as scanning packages and vehicles.
Career Highlights
Nicolas Hengartner has worked with prominent organizations, including Los Alamos National Security, LLC and Decision Sciences International Corporation. His experience in these companies has allowed him to apply his innovative ideas in practical settings, contributing to advancements in technology and research.
Collaborations
Hengartner has collaborated with notable colleagues, including Christopher L. Morris and Michael James Sossong. These partnerships have likely enriched his work and expanded the impact of his inventions.
Conclusion
Nicolas Hengartner's contributions to the fields of statistical analysis and charged particle detection demonstrate his innovative spirit and commitment to advancing technology. His patents reflect a deep understanding of complex systems and a desire to improve methodologies in his areas of expertise.