The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Apr. 23, 2008
Applicants:

Christopher L. Morris, Los Alamos, NM (US);

Alexander Saunders, Los Alamos, NM (US);

Michael James Sossong, Los Alamos, NM (US);

Larry Joe Schultz, Los Alamos, NM (US);

J. Andrew Green, Los Alamos, NM (US);

Konstantin N. Borozdin, Los Alamos, NM (US);

Nicolas W. Hengartner, Los Alamos, NM (US);

Richard A. Smith, San Diego, CA (US);

James M. Colthart, Poway, CA (US);

David C. Klugh, Black Diamond, WA (US);

Gary E. Scoggins, Issaquah, WA (US);

David C. Vineyard, Coronado, CA (US);

Inventors:

Christopher L. Morris, Los Alamos, NM (US);

Alexander Saunders, Los Alamos, NM (US);

Michael James Sossong, Los Alamos, NM (US);

Larry Joe Schultz, Los Alamos, NM (US);

J. Andrew Green, Los Alamos, NM (US);

Konstantin N. Borozdin, Los Alamos, NM (US);

Nicolas W. Hengartner, Los Alamos, NM (US);

Richard A. Smith, San Diego, CA (US);

James M. Colthart, Poway, CA (US);

David C. Klugh, Black Diamond, WA (US);

Gary E. Scoggins, Issaquah, WA (US);

David C. Vineyard, Coronado, CA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques, apparatus and systems for detecting particles such as muons for imaging applications. Subtraction techniques are described to enhance the processing of the muon tomography data.


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