Laurel, MD, United States of America

Nickolas J Kriska

This inventor holds 1 USPTO granted patent. Top assignee: Weatherchem Corporation. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nickolas J Kriska. Retrieved from https://idiyas.com/inventor/nickolas-j-kriska

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 54(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovations of Nickolas J Kriska

Introduction

Nickolas J Kriska is an accomplished inventor based in Laurel, MD (US). He has made significant contributions to the field of packaging with his innovative designs. His work is particularly noted for its practicality and efficiency in everyday use.

Latest Patents

Nickolas holds a patent for a Two Flap Container Cap. This invention showcases his ability to create solutions that enhance user experience and functionality in packaging. The patent reflects his commitment to innovation and improvement in product design.

Career Highlights

Nickolas is currently employed at Weatherchem Corporation, where he continues to develop and refine packaging solutions. His role at the company allows him to apply his inventive skills in a collaborative environment, contributing to the advancement of the industry.

Collaborations

Nickolas has worked alongside his coworker, John R Hickman, to further enhance their projects and share insights. Their collaboration exemplifies the importance of teamwork in the innovation process.

Conclusion

Nickolas J Kriska's contributions to the field of packaging through his patent and work at Weatherchem Corporation highlight his innovative spirit and dedication to improving everyday products. His achievements serve as an inspiration for future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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