Stanford, CA, United States of America

Nicholas Wayne Henderson

This inventor holds 1 USPTO granted patent. Top assignee: Yahoo! Inc.. Active years: 2010.


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Nicholas Wayne Henderson

Introduction

Nicholas Wayne Henderson is an accomplished inventor based in Stanford, CA. He has made significant contributions to the field of data processing and classification. His innovative approach has led to the development of a unique patent that enhances unsupervised classification methods.

Latest Patents

Henderson holds a patent titled "Automated clustering of records, biased by supervised classification processing." This invention improves an unsupervised classification approach by imposing order on the treatment of records and their attributes. The method identifies particular attributes most associated with 'good' records within various groups in a data set. By utilizing a supervised scoring method, the records are processed to indicate their measure of 'goodness.' This innovative technique allows for a bias during unsupervised clustering processing.

Career Highlights

Nicholas Wayne Henderson is currently employed at Yahoo! Inc., where he continues to apply his expertise in data classification and processing. His work has been instrumental in advancing the capabilities of data analysis within the company.

Collaborations

Henderson has collaborated with notable colleagues, including Joshua Ethan Miller Koran and David Anthony Burgess. Their combined efforts have contributed to the success of various projects within their field.

Conclusion

Nicholas Wayne Henderson's innovative work in automated clustering and supervised classification processing showcases his significant impact on data analysis. His contributions continue to influence advancements in the field, demonstrating the importance of innovation in technology.

Profile summary based on public USPTO records.
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