This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Intermec IP Corporation. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: The Innovations of Nicholas P. Allen
Introduction
Nicholas P. Allen is a notable inventor based in Edmonds, WA (US). He has made significant contributions to the field of automatic data collection devices. His work primarily focuses on enhancing the functionality and testing of devices such as barcode readers, RFID readers, and magnetic stripe readers.
Latest Patents
Nicholas holds a patent for testing automatic data collection devices. This patent outlines a method for testing these devices using ADC device test executables, modules, or processes stored at various network locations. The patent emphasizes the importance of defining sets of tests or work lists to facilitate effective testing. Tests can be identified by name and/or keyword, which may indicate one or more functionalities tested by the respective ADC device test module. He has 1 patent to his name.
Career Highlights
Nicholas is currently employed at Intermec IP Corporation, where he continues to innovate in the field of data collection technology. His work has contributed to the advancement of testing methodologies for automatic data collection devices, ensuring they meet industry standards and functionality requirements.
Collaborations
Throughout his career, Nicholas has collaborated with talented individuals such as Andrew C. Harding and Jeffrey K. Suhr. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Nicholas P. Allen's contributions to the field of automatic data collection devices highlight his expertise and commitment to innovation. His patent and work at Intermec IP Corporation demonstrate his significant impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile