Plano, TX, United States of America

Nicholas John Tovell

This inventor holds 2 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 1995-1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicholas John Tovell. Retrieved from https://idiyas.com/inventor/nicholas-john-tovell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 2

Forward Citations = 140(Granted Patents)


Company Filing History:


Years Active: 1995-1998

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2 patents (USPTO):Explore Patents

Title: Nicholas John Tovell: Inventor in Process Control.

Introduction

Nicholas John Tovell is an inventor based in Plano, Texas. His patent work includes inventions related to model-based process control, and he is associated with Texas Instruments Incorporated. Tovell holds 2 patents.

Latest Patents

Tovell’s listed patent, “Apparatus and Method for Model Based Process Control,” describes configuring a control strategy and process model to calculate a machine setting. The process model is then adjusted based on analysis of that setting to help control the machine. The supplied data lists this patent title and description twice.

Career Highlights

Tovell’s patent activity reflects work on applying process models and control strategies to machine operation. His association with Texas Instruments Incorporated connects his work to a company active in technology and innovation.

Collaborations

The supplied information identifies Jerry A. Stefani and Michael Francis Sullivan as Tovell’s coworkers. Their names are provided as professional connections, though no specific joint patent work is described.

Conclusion

Nicholas John Tovell’s listed inventions focus on model-based process control, with his patent record and company association highlighting his contributions to technology innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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