Dubuque, IA, United States of America

Nicholas J Hoefler

This inventor holds 1 USPTO granted patent. Top assignee: Deere & Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicholas J Hoefler. Retrieved from https://idiyas.com/inventor/nicholas-j-hoefler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nicholas J. Hoefler: Inventor of Track-Unit Usage Monitoring Technology.

Introduction

Nicholas J. Hoefler is an inventor based in Dubuque, Iowa, and works at Deere & Company. His patent work addresses monitoring the use of track units on work vehicles and providing feedback to support their operation and maintenance.

Latest Patents

Hoefler is associated with 1 patent: “Usage Profile Monitoring and Feedback for Track Units of a Work Vehicle.” The patent describes computer-implemented systems and methods that track how a vehicle’s ground-engaging units operate under selected track commands. The system calculates usage values over a specified period, scales them according to factors associated with the commands, and generates an output—such as an operator alert—when usage reaches or is predicted to exceed a target. Targets may relate to the track unit’s estimated life state or its total operating hours.

Career Highlights

Hoefler’s listed invention focuses on applying usage data to track-unit monitoring. By connecting operating patterns with estimated service life or operating-hour thresholds, the system can help inform decisions about track-unit condition and intervention.

Collaborations

Hoefler’s listed coworker is Adam G. Harwood. The patent is associated with Deere & Company.

Conclusion

Nicholas J. Hoefler’s patent work at Deere & Company centers on monitoring track-unit usage and providing timely feedback to support work-vehicle operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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