Ridgecrest, CA, United States of America

Nicholas Bottka


Average Co-Inventor Count = 2.0

ph-index = 8

Forward Citations = 197(Granted Patents)


Location History:

  • Springfield, VA (US) (1984)
  • Ridgecrest, CA (US) (1976 - 1985)
  • Burke, VA (US) (1985 - 1995)

Company Filing History:


Years Active: 1976-1995

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14 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Inventor Nicholas Bottka

Introduction

Nicholas Bottka, an accomplished inventor based in Ridgecrest, CA, has made significant contributions to the field of semiconductor technology. With a remarkable portfolio of 14 patents, he continues to push the boundaries of innovation, particularly in the area of non-destructive measurements of semiconductor properties.

Latest Patents

Among Nicholas Bottka's latest inventions is the "Method and apparatus for non-destructively measuring local resistivity." This innovative apparatus utilizes light sources to illuminate a semiconductor, such as InP, with two distinct light beams. The first beam excites the semiconductor by photo injecting carriers, while the second beam bombards the semiconductor with precisely selected photon energies. The apparatus measures changes in reflectance in response to these light beams, generating a photoreflectance line-shape that helps determine the resistivity of the semiconductor.

Another notable patent is the "Micro photoreflectance semiconductor wafer analyzer." This device measures local carrier concentration in a semiconductor by utilizing an exciting light, likely a laser, to alter the sample's band-gap. The emergence of electron hole pairs affects the reflectivity of the sample due to the Franz-Keldysh effect. An optical fiber transmits probing light to the excited area, allowing a comprehensive analysis of the spectral line shape and local electric field through a computer-driven optical analyzer.

Career Highlights

Nicholas Bottka's impressive career includes collaborations with significant entities, including the United States of America, as represented by the Secretary of the Navy. His work in this capacity has contributed to advancements in semiconductor technology, reflecting his dedication to scientific innovation. With 14 patents to his name, Bottka is recognized for his commitment to enhancing measurement techniques in semiconductors.

Collaborations

Throughout his career, Nicholas Bottka has worked alongside esteemed colleagues such as Marian E. Hills and D. Kurt Gaskill. These collaborations have fostered an environment of shared knowledge and ingenuity, further driving advancements in the field.

Conclusion

In summary, Nicholas Bottka is a formidable force in the realm of semiconductor innovation. His groundbreaking patents showcase his expertise and dedication to advancing technology in non-destructive measurement methods. As he continues to innovate, his contributions will undoubtedly shape the future of semiconductor research and applications.

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