This inventor holds 1 USPTO granted patent, plus 2 CIPO patents. Top assignee: The University of Waterloo. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Innovations of Nicholas Allec in X-ray Detection Technology.
Introduction
Nicholas Allec is an accomplished inventor based in Waterloo, Canada. He has made significant contributions to the field of medical imaging technology. His innovative work focuses on enhancing the capabilities of X-ray detection systems.
Latest Patents
Nicholas Allec holds a patent for a multi-layer flat panel X-ray detector. This invention comprises a first conversion layer, a second conversion layer, at least one printed circuit board for receiving signals generated by the first or second direct conversion layers, and a processor for processing the signals to produce an image being generated. This technology aims to improve the quality and efficiency of X-ray imaging.
Career Highlights
Nicholas Allec is affiliated with the University of Waterloo, where he contributes to research and development in imaging technologies. His work has garnered attention for its potential applications in medical diagnostics and imaging.
Collaborations
Nicholas has collaborated with several professionals in his field, including Karim Sallaudin Karim and Karim S Karim. These collaborations have furthered the development of innovative technologies in X-ray detection.
Conclusion
Nicholas Allec's contributions to the field of X-ray detection technology exemplify the impact of innovation in medical imaging. His patent for a multi-layer flat panel X-ray detector represents a significant advancement in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile