Hefei, China

Nianze Chen

This inventor holds 1 USPTO granted patent. Top assignee: Hefei Visionox Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nianze Chen. Retrieved from https://idiyas.com/inventor/nianze-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Nianze Chen: Innovator in Image Acquisition Technology

Introduction

Nianze Chen is a prominent inventor based in Hefei, China. He has made significant contributions to the field of image acquisition technology. His innovative work has led to the development of a unique method and system that enhances the way images are captured and processed.

Latest Patents

Nianze Chen holds a patent for an "Image acquisition method and system, and display panel." This invention involves acquiring N images of an object using N shooting devices, each with different fields of view. The method includes feature extraction from the images to obtain M features, where M is an integer multiple of N. This innovative approach allows for a more comprehensive analysis of the captured images.

Career Highlights

Nianze Chen is currently employed at Hefei Visionox Technology Co., Ltd. His work at this company has been instrumental in advancing image acquisition technologies. He has demonstrated a strong commitment to innovation and excellence in his field.

Collaborations

Nianze Chen collaborates with talented individuals such as Dandan Sun and Lei An. Their teamwork has contributed to the successful development of cutting-edge technologies in image acquisition.

Conclusion

Nianze Chen is a key figure in the realm of image acquisition technology, with a focus on innovative methods that improve image processing. His contributions continue to shape the future of this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…