Nhan T Do

Title: Nhan T Do - Innovator in Integrated Circuit Testing

Introduction

Nhan T Do is a notable inventor based in Irvine, California. He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent that enhances the efficiency of identifying defective parts in digital circuits.

Latest Patents

Nhan T Do holds a patent titled "Method of utilizing IDDQ tests to screen out defective parts." This invention introduces a method that leverages the effective widths of NMOS and PMOS devices in a digital circuit, along with their intrinsic junction and subthreshold leakage currents. The patent outlines a specification for IDDQ, the range of IDDQ, and the delta of IDDQ between pre- and post-overvoltage stress tests. This method effectively screens out defective integrated circuits that exhibit excessive extrinsic current leakage. The computer-implemented method generates an indication of whether the IDDQ values associated with tested integrated circuits fall within the IDDQ specification, thereby eliminating the need for time-intensive and costly burn-in testing.

Career Highlights

Nhan T Do is currently employed at Raytheon Company, where he applies his expertise in integrated circuit technology. His work focuses on improving testing methodologies that enhance the reliability of electronic components.

Collaborations

Throughout his career, Nhan T Do has collaborated with talented colleagues, including Emad S Zawaideh and Truc Q Vu. These collaborations have contributed to the advancement of innovative solutions in the field of electronics.

Conclusion

Nhan T Do's contributions to integrated circuit testing through his patent demonstrate his commitment to innovation and efficiency in technology. His work continues to impact the industry positively, paving the way for more reliable electronic devices.