Company Filing History:
Years Active: 1992
Title: Nesim Halyo: Innovator in Spectral Emissivity Measurement
Introduction
Nesim Halyo is a prominent inventor based in Williamsburg, VA (US). He has made significant contributions to the field of emissivity measurement through his innovative patent. His work focuses on developing advanced systems that enhance the accuracy and efficiency of emissivity determination.
Latest Patents
Nesim Halyo holds a patent for a "Directional spectral emissivity measurement system." This apparatus and process are designed to determine the emissivity of a test specimen. It includes an integrated sphere with two concentric walls that have coolant circulating between them. The system operates within a chamber that can be under ambient, vacuum, or inert gas conditions. A reference sample is placed within the sphere, aligned with a monochromatic light source. A pyrometer is also in optical alignment with the test sample, allowing for continuous temperature measurements during testing. The design features an arcuate slit port through the concentric walls, with a movable monochromatic light source that can be adjusted along the port. Additionally, a detector system is integrated to continuously detect an integrated signal indicative of all radiation within its field of view, based on the emissivity of the test specimen at various temperatures and angles. The system also includes a furnace capable of heating the test sample to approximately 3000 K, along with a control mechanism for transferring the heated sample to the test sample port in the integrating sphere.
Career Highlights
Nesim Halyo is associated with Information and Control Systems, Inc., where he applies his expertise in developing innovative measurement systems. His work has been instrumental in advancing the technology used in emissivity measurement.
Collaborations
Nesim collaborates with Dhirendra K Pandey, contributing to the development of cutting-edge technologies in their field.
Conclusion
Nesim Halyo's contributions to the field of spectral emissivity measurement highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in the accuracy of emissivity determination, showcasing his expertise and commitment to innovation.
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