Andover, MA, United States of America

Nejm Eddine Frigui

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Schneider Electric USA, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nejm Eddine Frigui. Retrieved from https://idiyas.com/inventor/nejm-eddine-frigui-93w8bubl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nejm Eddine Frigui and Industrial Alarm Detection

Introduction

Nejm Eddine Frigui is an inventor based in Andover, Massachusetts. His patent work addresses the analysis of alarm data in automation and industrial control systems.

Latest Patents

Frigui is associated with 1 patent, titled “Computer System and Method for Detecting Regularly Occurring Alarms in Automation and Industrial Control Systems.” The invention describes a computer monitoring system that analyzes alarm events and their timestamps, divides recurring time periods into equally spaced intervals, and represents alarm activity in each interval. It then compares the resulting alarm-state vectors to identify clusters of regularly recurring periods, helping reveal patterns in industrial alarm data.

Career Highlights

Frigui’s listed patent is associated with Schneider Electric USA, Inc. The invention reflects an application of data analysis to monitoring and understanding alarm behavior in industrial systems.

Collaborations

The provided information lists Sylvain Marié and Pablo Knecht among Frigui’s coworkers. Their names are included here as reported, without assuming a specific role in the patent.

Conclusion

Nejm Eddine Frigui’s patent focuses on identifying recurring alarm patterns through structured analysis of time-stamped events, contributing to the monitoring of automation and industrial control systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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