Sandiway, United Kingdom

Neil E Sanderson

This inventor holds 5 USPTO granted patents. Top assignees: Vg Instruments Group Limited, Fisons Ltd.. Active years: 1989-1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Neil E Sanderson. Retrieved from https://idiyas.com/inventor/neil-e-sanderson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.5

ph-index = 5

Forward Citations = 74(Granted Patents)


Company Filing History:


Years Active: 1989-1993

Loading Chart...
5 patents (USPTO):Explore Patents

Title: The Innovations of Neil E Sanderson

Introduction

Neil E Sanderson is a notable inventor based in Sandiway, Great Britain. He has made significant contributions to the field of mass spectrometry, holding a total of five patents. His work has advanced the technology used in various scientific applications.

Latest Patents

Among his latest patents are innovations in plasma sources mass spectrometry and a high-resolution plasma mass spectrometer. These inventions reflect his commitment to enhancing analytical techniques and improving measurement accuracy in scientific research.

Career Highlights

Throughout his career, Neil has worked with prominent companies such as VG Instruments Group Limited and Fisons Ltd. His experience in these organizations has allowed him to develop and refine his inventions, contributing to the advancement of mass spectrometry technology.

Collaborations

Neil has collaborated with notable individuals in his field, including Neil Bradshaw and Alan L Gray. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.

Conclusion

Neil E Sanderson's contributions to mass spectrometry through his patents and collaborations highlight his importance as an inventor in the scientific community. His work continues to influence advancements in analytical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…