Bloomington, IN, United States of America

Neelam Khanal

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Ecole Polytechnique Federale De Lausanne, Indiana University. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Neelam Khanal. Retrieved from https://idiyas.com/inventor/neelam-khanal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Neelam Khanal: Innovator in Polysaccharide Characterization

Introduction

Neelam Khanal is an accomplished inventor based in Bloomington, Indiana. He has made significant contributions to the field of polysaccharide characterization, showcasing his expertise through innovative methods and research.

Latest Patents

Khanal holds a patent for a method that characterizes polysaccharides. This method involves structural characterization through various physical measurements. It includes determining the mass of the polysaccharide using mass spectrometry, assessing the rotationally averaged cross section via ion mobility spectrometry, and analyzing the infrared spectrum through cryogenic, messenger-tagging IR spectroscopy.

Career Highlights

Throughout his career, Neelam Khanal has worked with prestigious institutions such as the École Polytechnique Fédérale de Lausanne and Indiana University. His work has been instrumental in advancing the understanding of polysaccharides and their applications.

Collaborations

Khanal has collaborated with notable colleagues, including Thomas Rizzo and Chiara Masellis, who have contributed to his research endeavors.

Conclusion

Neelam Khanal's innovative methods in polysaccharide characterization highlight his significant role in the field. His contributions continue to influence research and applications in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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