Filderstadt, Germany

Nedzad Halkic

This inventor holds 1 USPTO granted patent. Top assignee: Rpx Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nedzad Halkic. Retrieved from https://idiyas.com/inventor/nedzad-halkic

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Nedzad Halkic

Introduction

Nedzad Halkic is a notable inventor based in Filderstadt, Germany. He has made significant contributions to the field of digital camera technology. His work focuses on improving the accuracy and efficiency of camera systems.

Latest Patents

Halkic holds a patent for a method titled "Fast measurement of alignment data of a camera system." This innovative approach allows digital cameras to quickly obtain tilt information of the image sensor. By adjusting the lens to achieve maximum sharpness in at least three regions of interest, the tilt of the image sensor can be calculated. This method utilizes the corresponding lens/sensor distances and the distances of the different ROIs to the center of the image sensor. The yaw and pitch values of the tilt are then computed to facilitate proper sensor alignment. He has 1 patent to his name.

Career Highlights

Halkic is currently associated with Rpx Corporation, where he continues to develop and refine his innovative ideas. His work has garnered attention for its practical applications in enhancing camera performance.

Collaborations

Throughout his career, Halkic has collaborated with talented individuals such as Juergen Hausmann and Danny Chan. These partnerships have contributed to the advancement of his projects and the overall success of his innovations.

Conclusion

Nedzad Halkic's contributions to camera technology exemplify the impact of innovative thinking in the field of digital imaging. His patent for fast measurement of alignment data showcases his commitment to enhancing camera systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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