Cortlandt-Manor, NY, United States of America

Nedumaran Palani Kumanan

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nedumaran Palani Kumanan. Retrieved from https://idiyas.com/inventor/nedumaran-palani-kumanan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Nedumaran Palani Kumanan and Memory-Utilization Assessment

Introduction

Nedumaran Palani Kumanan is an inventor associated with Cortlandt-Manor, New York, and International Business Machines Corporation. His patent work addresses methods for evaluating how efficiently a program uses memory.

Latest Patents

The provided information lists one patent for Kumanan: “Methods and Apparatus for Assessing Health of Memory Utilization of a Program.” The invention describes obtaining images of a portion of memory and classifying the memory elements shown in those images into application-neutral categories, distinguishing data from structural overhead. It then analyzes the categorized elements using measures of memory-utilization efficiency and outputs the results. The listed total is 1 patent.

Career Highlights

Kumanan’s listed patent reflects work on assessing program memory use through image-based analysis and categorization. The provided information associates him with International Business Machines Corporation.

Collaborations

The listed coworkers are Gary Seth Sevitsky and Nicholas Matthew Mitchell. Their names are provided as collaborators associated with Kumanan’s work.

Conclusion

Nedumaran Palani Kumanan’s listed invention focuses on measuring memory-utilization efficiency by separating data from structural overhead and analyzing the resulting categories.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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