Waltham, MA, United States of America

Neal T Kurfiss

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sionyx, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Neal T Kurfiss. Retrieved from https://idiyas.com/inventor/neal-t-kurfiss

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Neal T. Kurfiss

Introduction

Neal T. Kurfiss is an accomplished inventor based in Waltham, MA (US). He has made significant contributions to the field of semiconductor technology. His innovative work focuses on enhancing the efficiency and cost-effectiveness of photo detectors.

Latest Patents

Neal T. Kurfiss holds a patent for a "High fill-factor laser-treated semiconductor device on bulk material with single side contact scheme." This patent describes systems and methods for configuring and constructing a single photo detector or an array of photo detectors. The unique design allows both the anode and cathode contacts of the diode to be placed on a single side, while a layer of laser-treated semiconductor is positioned on the opposite side. This configuration enhances cost-effectiveness, photon detection, and fill factor.

Career Highlights

Neal is currently employed at Sionyx, Inc., where he continues to develop innovative technologies in the semiconductor field. His work has been instrumental in advancing the capabilities of photo detection systems.

Collaborations

Neal has collaborated with notable colleagues, including James Edward Carey and Xia Li. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Neal T. Kurfiss is a prominent figure in semiconductor innovation, with a focus on improving photo detection technologies. His contributions have the potential to impact various applications in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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