Netanya, Israel

Naveh Levanon

This inventor holds 1 USPTO granted patent. Top assignee: Apple Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naveh Levanon. Retrieved from https://idiyas.com/inventor/naveh-levanon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Naveh Levanon in Depth Mapping Technology

Introduction

Naveh Levanon is an accomplished inventor based in Netanya, Israel. He has made significant contributions to the field of depth mapping technology. His innovative approach has led to the development of a unique patent that enhances the capabilities of imaging systems.

Latest Patents

Naveh Levanon holds a patent for a Multi-sensor depth mapping apparatus. This invention includes an illumination assembly that directs modulated optical radiation toward a target scene. A camera captures a two-dimensional image of the target scene, while a range sensor detects the respective times of flight of photons reflected from a matrix of locations across the target scene. The processor derives first depth coordinates based on these times of flight and computes a disparity correction function to generate a depth map of the target scene.

Career Highlights

Naveh is currently employed at Apple Inc., where he continues to innovate and develop advanced technologies. His work focuses on enhancing imaging systems and depth mapping techniques, which are crucial for various applications in the tech industry.

Collaborations

Naveh collaborates with talented individuals such as Shay Yosub and Assaf Avraham. These partnerships foster a creative environment that drives innovation and leads to groundbreaking advancements in technology.

Conclusion

Naveh Levanon's contributions to depth mapping technology exemplify the spirit of innovation. His patent and ongoing work at Apple Inc. highlight the importance of advancements in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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