Round Rock, TX, United States of America

Naveen Kumar Ramakrishna

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naveen Kumar Ramakrishna. Retrieved from https://idiyas.com/inventor/naveen-kumar-ramakrishna

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Naveen Kumar Ramakrishna and User Input Device Diagnostics.

Introduction

Naveen Kumar Ramakrishna is an inventor based in Round Rock, Texas, and is associated with Dell Products Inc. His work includes an invention for diagnosing user input devices in an Information Handling System (IHS).

Latest Patents

Ramakrishna is credited with 1 patent: “User Input Device Diagnostics.” The invention uses the IHS’s sensors to detect when a user is away from the system. While the user is absent, the system monitors input devices for activity. If an input is detected, diagnostic operations determine whether it is a spurious event or the result of a device fault. Monitoring and diagnostics end when the user returns, and identified faults are reported to the user.

Career Highlights

The patent addresses a practical challenge in system reliability: distinguishing unintended input from a malfunctioning device when no user is nearby. By combining proximity detection with input monitoring and diagnostics, the invention provides a way to identify and report potential faults.

Collaborations

Ramakrishna’s listed coworkers include Tao-Peng Chu and Chen Hsin Chang. The patent is associated with Dell Products Inc.

Conclusion

Naveen Kumar Ramakrishna’s patent focuses on improving the diagnosis of user input devices by detecting suspicious activity while a user is away and reporting faults when identified.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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