This inventor holds 2 USPTO granted patents. Top assignee: Ca, Inc.. Active years: 2017-2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017-2019
Title: Innovations by Naveen Arora
Introduction
Naveen Arora is an accomplished inventor based in Hyderabad, Telangana, India. He has made significant contributions to the field of software development, particularly in defect management. With a total of 2 patents, his work focuses on enhancing the efficiency and effectiveness of software applications.
Latest Patents
One of Naveen's latest patents is titled "Effective defect management across multiple code branches." This computer-implemented method detects when new source code linked to a defect identifier has been checked into a source code repository for a specific code branch of a software application. The innovative aspect of this patent is that the new source code is automatically checked into additional code branches based on the defect identifier. For each additional code branch, code coverage metrics are determined to assess the extent to which the application source code is tested by its corresponding test case source code before and after the automatic check-in. If the metrics indicate a decrease in code coverage beyond a predefined threshold, a notification is sent to indicate a test case deficiency for that code branch.
Career Highlights
Naveen Arora is currently employed at CA Technologies, a company known for its software solutions. His work at CA Technologies has allowed him to apply his innovative ideas in real-world applications, contributing to the advancement of software development practices.
Collaborations
Naveen has collaborated with notable coworkers, including Xien Yao and Ramanjaneyulu Mallisetty. These collaborations have fostered a creative environment that encourages the exchange of ideas and innovative solutions.
Conclusion
Naveen Arora's contributions to software development through his patents demonstrate his commitment to innovation and excellence in the field. His work not only addresses current challenges in defect management but also sets a foundation for future advancements in software engineering.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
