Kanagawa, Japan

Natsumi Kaneko


Average Co-Inventor Count = 3.6

ph-index = 1


Location History:

  • Kanagawa, JP (2023)
  • Ebina, JP (2023)

Company Filing History:


Years Active: 2023

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3 patents (USPTO):

Title: Natsumi Kaneko: Innovator in Electrophotographic Technology

Introduction

Natsumi Kaneko is a prominent inventor based in Kanagawa, Japan. She has made significant contributions to the field of electrophotographic technology, holding three patents that showcase her innovative spirit and technical expertise.

Latest Patents

Her latest patents include advancements in electrophotographic photoconductors, process cartridges, and image forming apparatuses. One notable patent describes an electrophotographic photoconductor that features a conductive substrate and a single-layer-type photoconductive layer. This layer contains a binder resin, a charge generating material, a hole transporting material, and an electron transporting material. The patent outlines specific parameters for the photoconductive layer, including an index A defined by a mathematical equation that considers Martens hardness, Young's modulus, and elastic deformation ratio. Another patent emphasizes the volume resistivity of the photoconductive layer after wear, ensuring it meets stringent performance criteria.

Career Highlights

Throughout her career, Natsumi Kaneko has worked with notable organizations such as Fujifilm Business Innovation Corporation and Chiba University. Her experience in these institutions has allowed her to refine her skills and contribute to groundbreaking research in her field.

Collaborations

Natsumi has collaborated with esteemed colleagues, including Yukimi Kawabata and Hideya Katsuhara. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Natsumi Kaneko's work in electrophotographic technology exemplifies her dedication to innovation and excellence. Her patents reflect her commitment to advancing the field and her ability to solve complex technical challenges.

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