The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jul. 13, 2021
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Yukimi Kawabata, Ebina, JP;

Keisuke Kusano, Ebina, JP;

Hideya Katsuhara, Ebina, JP;

Natsumi Kaneko, Ebina, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 5/06 (2006.01); G03G 21/18 (2006.01); G03G 5/05 (2006.01);
U.S. Cl.
CPC ...
G03G 5/061443 (2020.05); G03G 5/0564 (2013.01); G03G 5/0609 (2013.01); G03G 5/0696 (2013.01); G03G 21/1803 (2013.01);
Abstract

An electrophotographic photoconductor includes: a conductive substrate; and a single-layer-type photoconductive layer that is provided on the conductive substrate, contains a binder resin, a charge generating material, a hole transporting material, and an electron transporting material, and has an index A represented by the following equation (1) in a range of −7.98 or more and −7.28 or less, Equation (1): A=(0.057×M)−(0.002×F)−(0.252×μ), in which, in the equation (1), M represents a Martens hardness of the single-layer-type photoconductive layer, F represents a Young's modulus of the single-layer-type photoconductive layer, and μ represents an elastic deformation ratio of the single-layer-type photoconductive layer.


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