Kyoto, Japan

Natsuki Yoshida

This inventor holds 1 USPTO granted patent. Top assignee: Horiba, Ltd.. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Natsuki Yoshida. Retrieved from https://idiyas.com/inventor/natsuki-yoshida-kdnkxyag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1986

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Natsuki Yoshida and Time-Resolved Spectroscopy

Introduction

Natsuki Yoshida is an inventor associated with Horiba, Ltd. in Kyoto, Japan. Yoshida’s patent work concerns methods for measuring time-resolved emission and excitation spectra.

Latest Patents

Yoshida is credited with 1 patent: “Measuring Method for a Time-Resolved Emission Spectrum or a Time-Resolved Excitation Spectrum.” The method measures emission transient waveforms from a pulse-excited sample using time-correlated photon counting. It records waveforms at selected wavelengths across a relevant spectral region, stores the measurements in order, and uses the collected data to produce a time-resolved emission or excitation spectrum efficiently.

Career Highlights

Yoshida’s listed invention addresses the practical challenge of collecting transient waveform data across multiple wavelengths and assembling those measurements into a spectrum. The patent is associated with Horiba, Ltd., a company known for analytical and measurement technologies.

Collaborations

Issei Yokoyama and Kiyoaki Hara are identified as Yoshida’s coworkers. The available information does not specify their roles in the patent or the invention.

Conclusion

Natsuki Yoshida’s patent describes an efficient approach to producing time-resolved spectra from wavelength-by-wavelength transient measurements, reflecting a contribution to spectroscopic measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…