Munich, Germany

Natsuki Miyakawa

This inventor holds 1 USPTO granted patent. Top assignee: Ketek Gmbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Natsuki Miyakawa. Retrieved from https://idiyas.com/inventor/natsuki-miyakawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Natsuki Miyakawa: Innovator in X-ray Technology

Introduction

Natsuki Miyakawa is a prominent inventor based in Munich, Germany. She has made significant contributions to the field of radiation detection technology. Her innovative work focuses on the development of advanced materials for X-ray applications.

Latest Patents

Natsuki holds a patent for an X-ray radiation passage window designed for a radiation detector. This innovative window includes a radiation-transmissive element made from graphene. The patent outlines the use of this window in radiation detectors, along with methods for its production and applications of graphene in this context. She has 1 patent to her name.

Career Highlights

Natsuki is currently employed at Ketek GmbH, a company known for its advancements in radiation detection technology. Her work at Ketek has positioned her as a key player in the development of cutting-edge solutions in the industry.

Collaborations

Natsuki collaborates with notable colleagues, including Andreas Pahlke and Reinhard Fojt. Their combined expertise contributes to the innovative projects at Ketek GmbH.

Conclusion

Natsuki Miyakawa's contributions to X-ray technology exemplify her dedication to innovation in the field. Her work continues to influence advancements in radiation detection, showcasing the importance of her research and development efforts.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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