Clifton, NJ, United States of America

Nathaniel J McCaffrey

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 82(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Nathaniel J McCaffrey: Innovator in Multi-Wavelength Imaging Pyrometry

Introduction

Nathaniel J McCaffrey is a notable inventor based in Clifton, NJ (US). He has made significant contributions to the field of temperature measurement through his innovative work in multi-wavelength imaging pyrometry. His expertise and inventions have advanced the capabilities of non-contact temperature measurement technologies.

Latest Patents

Nathaniel J McCaffrey holds a patent for a Multi-wavelength Imaging Pyrometer. This apparatus and method enable non-contact real-time measurements of temperature and emissivity profiles of radiant targets with unknown spectral emissivity. The device images selected points or regions on the radiant target onto an array of photodetectors through an assembly of narrow-band optical filters. The produced multi-wavelength images are processed by a computer workstation, allowing for the extraction of 1D or 2D temperature and emissivity profiles through curve-fitting of the radiometric model of the imager sensor response to the measured response. Additionally, the method includes calibration techniques and compensation for inherent non-linearities of the pyrometer response.

Career Highlights

Nathaniel J McCaffrey is affiliated with the New Jersey Institute of Technology, where he continues to contribute to research and development in his field. His work has been instrumental in enhancing the accuracy and efficiency of temperature measurement technologies.

Collaborations

Throughout his career, Nathaniel has collaborated with esteemed colleagues, including Michael B Kaplinsky and Walter F Kosonocky. These collaborations have further enriched his research and innovation efforts.

Conclusion

Nathaniel J McCaffrey's contributions to the field of multi-wavelength imaging pyrometry exemplify his commitment to advancing technology in temperature measurement. His innovative patent and ongoing work at the New Jersey Institute of Technology highlight his role as a leading inventor in this specialized area.

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