This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: New Jersey Institute of Technology. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: Nathaniel J McCaffrey: Innovator in Multi-Wavelength Imaging Pyrometry
Introduction
Nathaniel J McCaffrey is a notable inventor based in Clifton, NJ (US). He has made significant contributions to the field of temperature measurement through his innovative work in multi-wavelength imaging pyrometry. His expertise and inventions have advanced the capabilities of non-contact temperature measurement technologies.
Latest Patents
Nathaniel J McCaffrey holds a patent for a Multi-wavelength Imaging Pyrometer. This apparatus and method enable non-contact real-time measurements of temperature and emissivity profiles of radiant targets with unknown spectral emissivity. The device images selected points or regions on the radiant target onto an array of photodetectors through an assembly of narrow-band optical filters. The produced multi-wavelength images are processed by a computer workstation, allowing for the extraction of 1D or 2D temperature and emissivity profiles through curve-fitting of the radiometric model of the imager sensor response to the measured response. Additionally, the method includes calibration techniques and compensation for inherent non-linearities of the pyrometer response.
Career Highlights
Nathaniel J McCaffrey is affiliated with the New Jersey Institute of Technology, where he continues to contribute to research and development in his field. His work has been instrumental in enhancing the accuracy and efficiency of temperature measurement technologies.
Collaborations
Throughout his career, Nathaniel has collaborated with esteemed colleagues, including Michael B Kaplinsky and Walter F Kosonocky. These collaborations have further enriched his research and innovation efforts.
Conclusion
Nathaniel J McCaffrey's contributions to the field of multi-wavelength imaging pyrometry exemplify his commitment to advancing technology in temperature measurement. His innovative patent and ongoing work at the New Jersey Institute of Technology highlight his role as a leading inventor in this specialized area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile