Monroe, NC, United States of America

Nathan Xiques

This inventor holds 1 USPTO granted patent. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nathan Xiques. Retrieved from https://idiyas.com/inventor/nathan-xiques

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nathan Xiques: Innovator in Remote Object Measurement

Introduction

Nathan Xiques is a notable inventor based in Monroe, NC (US). He has made significant contributions to the field of remote object measurement. His innovative approach combines technology and practicality, allowing for advancements in how objects are measured from a distance.

Latest Patents

Nathan Xiques holds a patent for "Systems and method for remote object measurement." This patent describes various systems and processes that achieve the measurement of remote objects. In particular implementations, the systems capture a digital image of the object to be measured and electronically sense the distance to it. Additionally, these systems can electronically determine the size of the measured object and transmit the location, image, and determined size to a remote server system. This invention showcases his ability to integrate technology with real-world applications.

Career Highlights

Throughout his career, Nathan has focused on developing innovative solutions that enhance measurement accuracy and efficiency. His work has garnered attention for its potential applications in various industries, including manufacturing and logistics.

Collaborations

Nathan has collaborated with talented individuals such as Bryan Fitzpatrick and Matt Thomas. Their combined expertise has contributed to the successful development of his patented technology.

Conclusion

Nathan Xiques is a pioneering inventor whose work in remote object measurement exemplifies the intersection of technology and innovation. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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