ROCHESTER, MN, United States of America

Nathan Lee Dunfee

USPTO Granted Patents = 3 

Average Co-Inventor Count = 4.1

ph-index = 1


Company Filing History:


Years Active: 2020-2025

where 'Filed Patents' based on already Granted Patents

3 patents (USPTO):

Title: Innovator Spotlight: Nathan L Dunfee - Pioneering High-Speed Chip Substrate Testing

Introduction: Meet Nathan L Dunfee, a brilliant inventor based in Rochester, MN (US), who has made significant strides in the field of semiconductor testing with his groundbreaking patent.

Latest Patents: Nathan L Dunfee holds a single patent for a "High-Speed Chip Substrate Test Fixture," a cutting-edge apparatus designed for testing high-speed signals through printed circuit boards.

Career Highlights: Nathan is associated with the renowned company International Business Machines Corporation (IBM), where he has leveraged his expertise to push the boundaries of technological advancement in the semiconductor industry.

Collaborations: Alongside his innovative work, Nathan collaborates with esteemed colleagues such as Lloyd Andre Walls and Nam Huu Pham, further enriching the landscape of semiconductor testing and research.

Conclusion: Nathan L Dunfee's pioneering work in the realm of high-speed chip substrate testing underscores his dedication to innovation and his invaluable contributions to the field. His patent stands as a testament to his ingenuity and commitment to advancing technology for the benefit of all.

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