The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Dec. 04, 2017
International Business Machines Corporation, Armonk, NY (US);
Lloyd A. Walls, Austin, TX (US);
Nam H. Pham, Round Rock, TX (US);
Jason R. Eagle, Mantorville, MN (US);
Nathan L. Dunfee, Rochester, MN (US);
Pavel Roy Paladhi, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus, multi-layer semiconductor substrate and system for testing a high-speed signal through a printed circuit board is provided. Embodiment of the present invention provides an apparatus comprises a multi-layer substrate, one or more transmission lines disposed within the multi-layer substrate, one or more connectors attached to the multi-layer substrate for connecting one or more test cards, a lid, comprising one or more cutouts for the one or more connectors, a clamp for compressing the multi-layer substrate against the lid, and one or more high-speed connectors attached to the one or more test cards, respectively.