Reese, MI, United States of America

Nathan J Mckenney

This inventor holds 1 USPTO granted patent. Top assignee: Tannas Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nathan J Mckenney. Retrieved from https://idiyas.com/inventor/nathan-j-mckenney

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nathan J Mckenney: Innovator in Wire Corrosion Testing

Introduction

Nathan J Mckenney is an accomplished inventor based in Reese, Michigan. He has made significant contributions to the field of wire corrosion testing. His innovative approach has led to the development of a unique patent that addresses critical issues in this area.

Latest Patents

Nathan holds a patent for a "Test board for wire corrosion testing." This invention is designed to enhance the reliability and efficiency of corrosion testing processes. It reflects his commitment to advancing technology in this important field. He has 1 patent to his name, showcasing his inventive capabilities.

Career Highlights

Nathan is currently employed at Tannas Company, where he applies his expertise in developing innovative solutions. His work at Tannas Company has allowed him to collaborate with other talented professionals in the industry. His contributions have been instrumental in driving the company's success.

Collaborations

One of Nathan's notable coworkers is Christopher Mark Charlebois. Together, they have worked on various projects that leverage their combined knowledge and skills. Their collaboration has fostered a creative environment that encourages innovation.

Conclusion

Nathan J Mckenney is a dedicated inventor whose work in wire corrosion testing has made a significant impact. His patent and contributions at Tannas Company highlight his role as a key player in advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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