Enumclaw, WA, United States of America

Nathan Darrel Staley

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Blue Origin Manufacturing, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nathan Darrel Staley. Retrieved from https://idiyas.com/inventor/nathan-darrel-staley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Nathan D. Staley and His Payload Fairing Manufacturing Patent.

Introduction

Nathan D. Staley is an inventor based in Enumclaw, Washington, whose patent work includes a manufacturing system for payload fairings. He is associated with Blue Origin Manufacturing, LLC.

Latest Patents

Staley is named on one patent, titled “Capture and Pivot Installation Fittings.” The patent describes systems and methods for manufacturing a payload fairing, including nesting scaffolding inside the fairing shell so workers can inspect and manually work on its interior surface during production.

The disclosed fitting uses a capture bucket on a mold and a pivot pin on nose scaffolding. When engaged, these components constrain translation along all axes and limit rotation to a single axis, allowing the inner bowl to be raised or lowered within the mold while controlling its position.

Career Highlights

Staley’s listed patent contribution addresses the practical challenges of accessing and positioning scaffolding within a payload fairing during manufacturing. His record includes 1 patent.

Collaborations

The patent information also names Park O. Cover, Jr. and Taylor R. Ladzinski as Staley’s coworkers.

Conclusion

Nathan D. Staley’s patent describes a controlled pivot fitting designed to support interior access and work during payload fairing manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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