Cleveland, OH, United States of America

Nathan A Schatt


 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Nathan A Schatt: Innovator in Electrical Measurement Systems

Introduction

Nathan A Schatt is a notable inventor based in Cleveland, OH (US). He has made significant contributions to the field of electrical measurements, particularly in reducing noise caused by mechanical vibrations. His innovative approach has led to the development of a unique electronic test measurement system.

Latest Patents

Nathan A Schatt holds a patent for the invention titled "Rejection of mechanical vibration induced noise in electrical measurements." This patent describes an electronic test measurement system that includes a device under test (DUT) and an electronic test instrument. The system features a signal input configured to receive an electrical signal from the DUT, a cooling mechanism, and a processor. The processor is designed to determine the optimal frequency for the cooling mechanism's operation, select a filter based on this frequency, and apply the filter to the electrical signal. This process effectively reduces interference caused by mechanical vibrations of the cooling mechanism.

Career Highlights

Nathan A Schatt is currently employed at Keithley Instruments, Inc., where he continues to innovate in the field of electronic testing. His work has been instrumental in enhancing the accuracy and reliability of electrical measurements.

Collaborations

Throughout his career, Nathan has collaborated with talented individuals such as Gregory Sobolewski and Michael D Rayman. These collaborations have contributed to the advancement of technology in electrical measurement systems.

Conclusion

Nathan A Schatt's contributions to the field of electrical measurements demonstrate his commitment to innovation and excellence. His patent for reducing mechanical vibration-induced noise showcases his ability to solve complex problems in electronic testing.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…