Ervillers, France

Nathalie Degallaix

This inventor holds 1 USPTO granted patent. Top assignee: Genfit. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nathalie Degallaix. Retrieved from https://idiyas.com/inventor/nathalie-degallaix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Nathalie Degallaix: Innovator in Automated Pattern Recognition

Introduction

Nathalie Degallaix is a prominent inventor based in Ervillers, France. She has made significant contributions to the field of histology through her innovative work. Her expertise lies in developing automated methods that enhance the analysis of histological images.

Latest Patents

Nathalie holds a patent for an "Automated pattern recognition and scoring method of histological images." This invention presents a novel approach to automating the recognition and scoring of patterns within histological images, which can greatly improve diagnostic accuracy and efficiency in medical settings. She has 1 patent to her name.

Career Highlights

Nathalie is currently associated with Genfit, a company known for its focus on innovative solutions in the field of biotechnology. Her work at Genfit has allowed her to apply her research in practical settings, contributing to advancements in medical diagnostics.

Collaborations

Throughout her career, Nathalie has collaborated with notable colleagues, including John Brozek and Benoît Noel. These partnerships have fostered a collaborative environment that enhances innovation and research outcomes.

Conclusion

Nathalie Degallaix is a trailblazer in the field of automated pattern recognition in histology. Her contributions are paving the way for advancements in medical diagnostics and improving patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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