Company Filing History:
Years Active: 2006-2013
Title: Nat Ceglio: Innovator in Specimen Inspection Technologies
Introduction
Nat Ceglio is a notable inventor based in Pleasanton, CA (US), recognized for his contributions to the field of specimen inspection technologies. With a total of 4 patents to his name, Ceglio has developed innovative methods and systems that enhance the inspection process of various specimens.
Latest Patents
Ceglio's latest patents focus on methods and systems for inspecting specimens using different inspection parameters. One of his computer-implemented methods involves determining optimal parameters for inspection based on selected defects. This method includes setting the parameters of an inspection system at these optimal levels prior to conducting the inspection. Another method involves illuminating the specimen with light at wavelengths both below and above 350 nm. This approach also includes processing signals that represent the light collected from the specimen to detect defects or variations in the specimen. Additionally, one of his systems is designed to inspect a specimen and includes a first optical subsystem connected to a broadband light source, a second optical subsystem linked to a laser, and a third optical subsystem that couples light from the first and second subsystems to an objective, which focuses the light onto the specimen.
Career Highlights
Throughout his career, Nat Ceglio has worked with prominent companies in the technology sector, including KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed significantly to his expertise in the field of optical inspection systems.
Collaborations
Ceglio has collaborated with several professionals in his field, including Shiow-Hwei Hwang and Steve R. Lange. These collaborations have likely enriched his work and led to advancements in the technologies he has developed.
Conclusion
Nat Ceglio's innovative work in specimen inspection technologies has made a significant impact in the field. His patents reflect a commitment to improving inspection methods and systems, showcasing his role as a key inventor in this area.