Kanagawa, Japan

Naruhiko Nishiwaki

This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignees: Nhk Spring Co., Ltd., Nhk Spring, Ltd.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naruhiko Nishiwaki. Retrieved from https://idiyas.com/inventor/naruhiko-nishiwaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Naruhiko Nishiwaki: Innovator in Probe Card Technology

Introduction

Naruhiko Nishiwaki is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of technology, particularly in the development of probe cards. His innovative designs have paved the way for advancements in electronic testing.

Latest Patents

Naruhiko Nishiwaki holds a patent for a probe card that includes a plurality of conductive contact probes. The design features a probe head configured to accommodate the ends of these probes, along with a laminated member and a fastening member that securely connects the components. This invention enhances the efficiency and reliability of electronic testing processes.

Career Highlights

Naruhiko is associated with NHK Spring Co., Ltd., where he has applied his expertise in engineering and innovation. His work has been instrumental in improving the functionality of electronic devices through advanced testing methods.

Collaborations

Throughout his career, Naruhiko has collaborated with talented individuals such as Kazuya Soma and Satoshi Shoji. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Naruhiko Nishiwaki's contributions to probe card technology exemplify his commitment to innovation in the electronics industry. His patent and collaborative efforts continue to influence advancements in electronic testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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