Musheerabad, India

Narasimham Lanka

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2014.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Narasimham Lanka: Innovator in Condition Monitoring Technology

Introduction

Narasimham Lanka is a notable inventor based in Musheerabad, India. He has made significant contributions to the field of condition monitoring technology. His innovative approach has led to the development of a unique patent that addresses critical aspects of device monitoring.

Latest Patents

Narasimham Lanka holds a patent for a "Method and system for use in condition monitoring." This condition monitoring system includes at least one computing device, a memory device configured to store data associated with a monitored device, and at least one input channel that receives the data. The system is designed to determine potential fault conditions by comparing the monitored data with programmed scenarios based on predetermined events related to the device's condition. He has 1 patent to his name.

Career Highlights

Narasimham Lanka is currently associated with General Electric Company, where he applies his expertise in developing advanced monitoring systems. His work has been instrumental in enhancing the reliability and efficiency of various devices through innovative monitoring solutions.

Collaborations

Narasimham has collaborated with Karthikeyan Loganathan, a coworker who shares a commitment to advancing technology in their field. Their partnership has fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Narasimham Lanka's contributions to condition monitoring technology exemplify the impact of innovation in enhancing device reliability. His patent and ongoing work at General Electric Company highlight his role as a key figure in this important field.

Profile summary based on public USPTO records.
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