Naoyuki Shiratori

Title: Naoyuki Shiratori: Innovator in Film Thickness Measurement

Introduction

Naoyuki Shiratori is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly in the area of film thickness measurement. With a total of 2 patents, his work has advanced the understanding and application of infrared measurement techniques.

Latest Patents

Shiratori's latest patents include a measuring method and apparatus for gloss irregularity and an infrared multilayer film thickness measuring method and apparatus. The latter patent describes a method and apparatus for measuring the thicknesses of film layers made from different synthetic resins that form a composite multilayer film or sheet. This innovative approach utilizes infrared rays of specific wavelengths, which correspond to the infrared absorption wavelengths of each film layer, along with at least one reference wavelength. By projecting these infrared rays onto the multilayer film, ratios are obtained between the amounts of infrared light transmitted through the film. This data is then used to solve a simultaneous equation that includes the ratios and the infrared absorption coefficients of the film layers, allowing for accurate measurement of the film layer thicknesses.

Career Highlights

Throughout his career, Naoyuki Shiratori has worked with notable companies such as Asahi-Dow Limited and Asahi Kasei Kogyo Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in measurement technologies and innovations.

Collaborations

Some of his coworkers include Akitaka Yasujima and Shingo Ishikawa. Their collaboration has likely fostered an environment of innovation and creativity in their respective fields.

Conclusion

Naoyuki Shiratori's contributions to the field of measurement technology, particularly through his patents, highlight his role as an influential inventor. His work continues to impact the industry and advance measurement techniques.