Company Filing History:
Years Active: 2002-2007
Title: Naoyoshi Kikuchi: Innovator in Probe Card Technology
Introduction
Naoyoshi Kikuchi, an accomplished inventor based in Kawasaki, Japan, has made significant contributions to the field of probe card technology. With two patents to his name, Kikuchi continues to innovate in the electronic testing sector. His work focuses on creating high-efficiency, cost-effective solutions that improve the testing and evaluation processes for various electronic devices.
Latest Patents
Kikuchi's latest inventions include a "Probe Card and Method for Manufacturing Probe Card" and a "System and Method for Testing and Evaluating a Device." The probe card he developed is designed to be manufactured inexpensively, featuring a base plate, a flexible substrate, and contact probes made of polyimide resin. These probes consist of a plurality of parallel wires, each with a distal end functioning as a contact. This innovative approach utilizes a general-purpose substrate that is cut to size, aligning the number of parallel wires with the pads of an LSI chip.
In his second patent, Kikuchi developed a system for testing and evaluating devices, such as LSI devices, which addresses issues related to defect factors. The system classifies terminals into various types based on different testing conditions and obtains critical data regarding testing margins by adjusting conditions for each terminal type. This ensures efficient detection of faulty terminals, enhancing the overall reliability of electronic devices.
Career Highlights
Naoyoshi Kikuchi currently works at Fujitsu Corporation, where he leverages his expertise to drive innovation in electronic testing technologies. His contributions have not only advanced Fujitsu's capabilities but have also influenced the industry standards for probe cards and testing systems.
Collaborations
Throughout his career, Kikuchi has collaborated with talented coworkers, such as Masahiro Kanase and Takayuki Katayama. These partnerships have facilitated the exchange of ideas and knowledge, fostering an environment of innovation and excellence in their projects.
Conclusion
Naoyoshi Kikuchi stands out as a notable inventor in the realm of electronic testing, with impactful patents that promise to enhance device reliability and manufacturing efficiency. His work at Fujitsu Corporation and collaborations with skilled professionals underscore his commitment to driving technological advancements. Kikuchi's innovative solutions are setting new benchmarks in the industry, paving the way for future developments in probe card technology.