The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Mar. 25, 2003
Yoshikazu Arisaka, Kawasaki, JP;
Kunihiro Itagaki, Kawasaki, JP;
Shigenobu Ishihara, Kawasaki, JP;
Tomohiro Giga, Kawasaki, JP;
Naoyoshi Kikuchi, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kunihiro Itagaki, Kawasaki, JP;
Shigenobu Ishihara, Kawasaki, JP;
Tomohiro Giga, Kawasaki, JP;
Naoyoshi Kikuchi, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.