Makinohara, Japan

Naoya Yaguchi

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Yazaki Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoya Yaguchi. Retrieved from https://idiyas.com/inventor/naoya-yaguchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 33.3

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Naoya Yaguchi: Innovator in Wire Stripping Technology

Introduction

Naoya Yaguchi is a notable inventor based in Makinohara, Japan. He has made significant contributions to the field of wire processing technology. His innovative approach has led to the development of a unique device that enhances the efficiency of wire stripping.

Latest Patents

Yaguchi holds a patent for a "Device and method for forming a notch for stripping." This invention includes several cutting mechanisms designed to improve the wire stripping process. Each mechanism features a stopper that can approach or separate from the outer circumferential surface of a coated electric wire. The device also incorporates a biasing part, a cutter blade, and movement mechanisms that work together to form a precise notch.

Career Highlights

Naoya Yaguchi is associated with Yazaki Corporation, a leading company in the automotive industry. His work at Yazaki has allowed him to focus on innovations that improve wire harness technology. His patent reflects his commitment to enhancing manufacturing processes and product quality.

Conclusion

Naoya Yaguchi's contributions to wire stripping technology exemplify the spirit of innovation. His patent demonstrates a practical solution to a common challenge in the industry. His work continues to influence advancements in wire processing techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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