Kanagawa, Japan

Naoya Saito

USPTO Granted Patents = 3 

Average Co-Inventor Count = 2.8

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Atsugi, JP (2019)
  • Kanagawa, JP (1994 - 2020)

Company Filing History:


Years Active: 1994-2020

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3 patents (USPTO):Explore Patents

Title: Naoya Saito: Innovator in X-ray Inspection Technology

Introduction

Naoya Saito is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of X-ray inspection technology, holding a total of 3 patents. His innovative designs focus on enhancing the efficiency and effectiveness of X-ray inspection apparatuses.

Latest Patents

One of Saito's latest inventions is an X-ray inspection apparatus that utilizes a multiple-stage X-ray sensor. This design allows for high sensitivity inspections without the need to widen the slit of a collimator, thus preventing the apparatus from becoming oversized due to X-ray leakage. The apparatus includes an X-ray irradiation portion with an X-ray tube, a multi-stage X-ray sensor, and an imaging condition input section for designating detection element arrays for inspection.

Another notable invention is an X-ray inspection device that achieves high cooling efficiency without relying on expensive air conditioning systems. This device features a first case divided into multiple cooling partitions, each containing heat sources with specific use limit temperatures. The design ensures excellent cooling efficiency and cleaning properties, as the heat radiation member is integrated into a second case that communicates with external air.

Career Highlights

Saito has worked with notable companies such as Anritsu Infivis Co., Ltd. and Canon Inc. His experience in these organizations has contributed to his expertise in developing advanced X-ray inspection technologies.

Collaborations

Throughout his career, Saito has collaborated with talented individuals, including Hidehiko Fukahori and Shigeru Yamagami. These collaborations have further enriched his work and innovations in the field.

Conclusion

Naoya Saito's contributions to X-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the technical challenges in the field and a dedication to creating effective solutions.

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