Anritsu Infivis Co., Ltd.

Canon Kabushiki Kaisha

Naoya Saito

Hidehiko Fukahori

Hisashi Hayashi

Shigeru Yamagami

Itaru Miyazaki

Takashi Kanai

Toshiaki Kikuchi

Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.

X-ray inspection apparatus

An X-ray inspection device achieves a high cooling effect without using an expensive air conditioner and is excellent in cleaning property. The inside of a first case of an X-ray inspection device is separated into plural cooling partitions by separation walls by the use limit temperature and the like, and heat sources respectively having intrinsic use limit temperature are stored in respective partitions. Because a flow passage of air is set inside the cooling partition so that the heat sources having low use limit temperature are disposed upstream of the heat sources having high use limit temperature, the cooling efficiency is excellent. A heat absorption member of a heat exchange device exists inside the first case, and a heat radiation member exists inside a second case communicating with the external air. Because there is no protrusion of the heat radiation member as the total cases, cleaning property is excellent.

X-ray inspection device

A camera of the kind having a built-in flash device, which is movable to a usable position by popping up the flash device from its stowed position in using the flash device, is arranged such that the lens panel of the flash device is formed with split panels, and the flash device can be stowed in a compact state by causing the split panels to overlap each other when the flash device is in the stowed position.

Camera with built-in flash device

Growing community of inventors

Kanagawa, Japan

Naoya Saito